MHW-25-S-16CH

MHW-25-S MHW-25-S-16CH (4 Temperature Zone)MHWX-200 (Refrigerate via Compressor)MHW-480 (Refrigerate via All-in-One Compressor)MIHW-200-160CH-B (single stage compressor cooling systems)

Overview Specs Downloads FAQ Video

MHW-25-S MHW-25-S-16CH (4 Temperature Zone)MHWX-200 (Refrigerate via Compressor)MHW-480 (Refrigerate via All-in-One Compressor)MIHW-200-160CH-B (single stage compressor cooling systems)

MHW-25-S-16CH

Overview Specs Downloads FAQ Video

Desktop Constant Temperature Test Chamber

MHW-25-S-16CH

Volume, size and weight
Nominal Internal Volume

25L
Inside Dimensions

W360 mm×D300 mm×H235 mm
Overall Dimension

W440 mm×D580 mm×H410 mm
Weight

About 45kg
Performance
Testing environment

Ambient temperature: +25 ℃, relative humidity: ≤ 85%, there is no sample in the test chamber (no load)
Temperature Range

15～60℃
Temperature Fluctuation

≤1℃ (Equivalent to ± 0.5 ℃, no load with stable temperature)
Temperature Deviation

±2.0℃ (No Load and Stable Temperature)
Heating Time

25℃→60℃ ≤50 min (No load, average nonlinearity)
Cooling Time

25℃→15℃ ≤60 min (No load, average nonlinearity)
Structure Characteristics
Thermal insulation enclosure

Outer wall material: high quality cold rolled steel plate, surface sprayed with plastic and painted.

Inner wall material: stainless steel plate SUS304.

Chamber insulation material: polyurethane foam.
Air Conditioning Channel

DC fan, semiconductor refrigeration (heating) module
Standard Configuration of Test Chamber

Chamber door: hollow tempered glass and frame;

Cell clamp connecting plate: 2 pieces;

Lighting: LED lights.
Control Panel

Touch control button
Air conditioning unit

Semiconductor refrigeration (heating) module
Electric Control System
Controller

LED digital display and touch key controller.
Setting Method

Touch key type
Control Mode

Forced circulation ventilation. The control system controls the output of the semiconductor refrigeration (heating) module through the PID automatic calculation output results according to the set temperature value, so as to achieve dynamic balance.
Communication Mode

Ethernet Standard Interface
Cell Test Equipment and Test Interconnection
Testing Equipment

Up to 2 units totaling 16CH (mA Equipment)
Middle Machine

One
Network Switch

One
Using Conditions: The following conditions are guaranteed by the user (the user is responsible for the installation of the power supply lines of the equipment)
Installed Fields

Well ventilated;

No strong vibration around the equipment;

No strong electromagnetic field around the equipment;

No flammable, explosive, corrosive materials and dust around the equipment.
Environment Condition

Temperature: 25℃±3℃;

Relative humidity: < 85%;

Pressure: 86kPa~106 kPa.
Power Supply/ Capacity/ Maximum Current

AC(220±10%)V /50Hz or AC(110±10%)V /60Hz (Single Phase and Protected Earth Wire)

0.2kW

1A (220V) or 2A (110V)
Others

Opening the door of the test chamber while testing will cause temperature fluctuation in the chamber.
Cell Specification and Placement Method
Cell Specification

Coin Cell (milliampere level)
Cell Placement Mode

Plug on the left and right walls of the inner chamber.